The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Sep. 29, 2022
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Alexander Galle, Treuen, DE;

Thomas Eckl, Hirschau, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 23/188 (2006.01); B41F 13/02 (2006.01); B41F 33/00 (2006.01); B65H 23/04 (2006.01);
U.S. Cl.
CPC ...
B65H 23/1882 (2013.01); B65H 23/046 (2013.01); B41F 13/025 (2013.01); B41F 33/0081 (2013.01); B41P 2213/90 (2013.01);
Abstract

A method for correcting a measurement value of a reference mark on a material web is disclosed. A controller, a machine, a computer program and a computer program product can perform a correction of this type. To improve determination of the position of a reference mark on a material web, a machine in which the material web is moved in a conveying direction has at least one tool that functions in a non-positive locking manner, a second tool that functions in a non-positive locking manner and is located downstream of the first tool in the conveying direction, and a sensor that is located between the two tools. A measurement error in the sensor which arises as a result of an adjustment of the second tool is determined at least approximately at least via parameter values of the second tool. The measurement value is corrected by the measurement error.


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