The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Jun. 25, 2024
Carl Zeiss Meditec Ag, Jena, DE;
Christian Voigt, Abtsgmuend, DE;
Markus Philipp, Aalen, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method for operating a microscopy system is provided. The microscopy system includes a microscope and a stand supporting the microscope. The microscope is arranged on the stand. The stand includes at least one drive device configured to move the microscope. The method includes determining a specified value or a specified change of a modulable inertia of the microscopy system based on a state variable and/or based on user information and/or based on a force acting on the microscopy system and/or based on a current instance of application. The at least one drive device is controlled such that a divergence between the specified value and an actual value of the modulable inertia is reduced or the modulable inertia is varied in accordance with the specified change.