The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Oct. 13, 2023
Applicant:

Cilag Gmbh International, Zug, CH;

Inventors:

Frederick E. Shelton, Iv, Hillsboro, OH (US);

Taylor W. Aronhalt, Loveland, OH (US);

Shane R. Adams, Lebanon, OH (US);

Nicholas J. Ross, Franklin, OH (US);

Kevin M. Fiebig, Cincinnati, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 17/072 (2006.01); A61B 17/00 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 17/072 (2013.01); A61B 2017/00022 (2013.01); A61B 2017/00132 (2013.01); A61B 2017/00398 (2013.01); A61B 2017/07278 (2013.01); A61B 2017/07285 (2013.01); A61B 2090/064 (2016.02);
Abstract

A surgical system is configured to deploy staples from a staple cartridge reload into tissue. The surgical system includes a first sensor configured to measure a first parameter indicative of a force to form the staples, and a second sensor configured to measure a second parameter indicative of a position of a sled along a staple-forming distance. The system further includes a control circuit communicatively connected to a motor, the first sensor, and the second sensor, wherein the control circuit is configured to: receive a first signal from the first sensor indicative of the first parameter; receive a second signal from the second sensor indicative of the second parameter; and detect staple malformation of the staples based on the first signal and the second signals.


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