The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Jun. 07, 2022
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventors:

Nicholas R Konkle, Sussex, WI (US);

Brian D Yanoff, Niskayuna, NY (US);

John M Boudry, Waukesha, WI (US);

Assignee:

GE PRECISION HEALTHCARE LLC, Wauwatosa, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/42 (2024.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); A61B 6/58 (2024.01); B23K 26/21 (2014.01); G01R 31/28 (2006.01); G01R 31/52 (2020.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
A61B 6/586 (2013.01); A61B 6/032 (2013.01); A61B 6/4241 (2013.01); A61B 6/5205 (2013.01); A61B 6/5258 (2013.01); B23K 26/21 (2015.10); G01R 31/28 (2013.01); G01R 31/52 (2020.01); G01T 1/242 (2013.01); G01T 1/247 (2013.01);
Abstract

Methods and systems are provided for repairing a defective segment of a sensor array of a photon counting detector of a photon counting computed tomography (PCCT) imaging system. In one example, a method for a PCCT imaging system comprises dividing a segment of the sensor array into a plurality of sub-segments, wherein each sub-segment of the plurality of sub-segments is electrically coupled to a readout electronics, the readout electronics configured to calculate a photon count for the segment; generating a total photon count for the divided segment based on combined electrical signals produced at each sub-segment of the divided segment; and reconstructing an image based on the total photon count at the divided segment. A defect detected in the divided segment may be traced to a defective sub-segment, which may be isolated from the readout electronics, thereby increasing a quality of the reconstructed image.


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