The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Jun. 24, 2022
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Masato Yoshioka, Kanagawa, JP;

Masaaki Oosake, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/06 (2006.01); A61B 1/00 (2006.01); A61B 5/06 (2006.01); A61B 5/107 (2006.01); G06T 7/62 (2017.01);
U.S. Cl.
CPC ...
A61B 5/1076 (2013.01); A61B 1/00045 (2013.01); A61B 1/06 (2013.01); A61B 1/0605 (2022.02); A61B 5/064 (2013.01); G06T 7/62 (2017.01); G06T 2207/10068 (2013.01);
Abstract

In an endoscope apparatus including a processor, the processor specifies the position of a specific region and sets a reference scale in a picked-up image that is obtained from the image pickup of a subject on which the specific region formed by auxiliary measurement light is formed. Then, the processor extracts a region of interest, determines a measurement portion, calculates a measured value obtained from the measurement of the measurement portion, on the basis of the reference scale, and generates a measured value marker using the measured value. Further, the processor creates a specific image in which the measured value marker is superimposed on the picked-up image.


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