The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Jan. 20, 2023
Applicant:

Crystalvue Medical Corporation, Taoyuan, TW;

Inventors:

Hsuan-Hao Chao, Tainan, TW;

Sung-Yang Wei, New Taipei, TW;

William Wang, Taoyuan, TW;

Chung-Cheng Chou, Luzhu Township, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); G02B 26/10 (2006.01); G02B 26/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/1005 (2013.01); G02B 26/105 (2013.01); G02B 26/121 (2013.01);
Abstract

An optical detection device and an operation method thereof is disclosed. The optical detection device includes a light source, an optical coupling element, a reference optical path modulation element and a data processing element. The light source provides an incident light. The optical coupling element divides the incident light into a reference light and a detection light and emits them to the reference optical path modulation element and the sample to be tested respectively. The reference optical path modulation element reflects the reference light and rapidly changes the light path of reference light. The optical coupling element interferes the reference light reflected by the reference optical path modulation element and the detection light reflected by the sample to be tested to generate an optical interference signal. The data processing element receives and analyzes the optical interference signal to obtain an optical detection result about the sample to be tested.


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