The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 18, 2025
Filed:
Feb. 16, 2024
Alcon Inc., Fribourg, CH;
Ramesh Sarangapani, Coppell, TX (US);
Mark Vontress, Arlington, TX (US);
Alcon Inc., Fribourg, CH;
Abstract
A system and method of assessing vision quality of an eye is presented, with a controller having a processor and tangible, non-transitory memory on which instructions are recorded. The controller is configured to selectively execute at least one machine learning model. Execution of the instructions by the processor causes the controller to: receive wavefront aberration data of the eye and express the wavefront aberration data as a collection of Zernike polynomials. The controller is configured to obtain a plurality of input factors based on the collection of Zernike polynomials. The plurality of input factors is fed into the at least one machine learning model, which is trained to analyze the plurality of input factors. The machine learning model generates at least one vision correction factor based in part on the plurality of input factors.