The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2025

Filed:

Mar. 23, 2020
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Koji Kashima, Tokyo, JP;

Takeshi Miyai, Tokyo, JP;

Junichiro Enoki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); A61B 1/04 (2006.01); G06T 5/73 (2024.01); G06T 7/55 (2017.01);
U.S. Cl.
CPC ...
A61B 1/000095 (2022.02); A61B 1/043 (2013.01); G06T 5/73 (2024.01); G06T 7/55 (2017.01); G06T 2207/10028 (2013.01);
Abstract

An EDOF signal processing unit performs EDOF signal processing as restoration processing on a special light image acquired by imaging an observation target irradiated with special light, and a setting unit sets a restoration degree of the EDOF signal processing for the EDOF signal processing unit. Then, a parameter for the restoration degree in the EDOF signal processing on the special light image is set so as to make the restoration degree in the EDOF signal processing on the special light image lower than a restoration degree in EDOF signal processing as restoration processing on a normal light image acquired by imaging the observation target irradiated with normal light. The present technology may be applied to, for example, a medical image processing system that performs special light observation.


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