The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Dec. 21, 2020
Applicant:
Topcon Corporation, Tokyo, JP;
Inventors:
Ryoichi Hirose, Tokyo, JP;
Suguru Miyagawa, Tokyo, JP;
Assignee:
TOPCON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01); H04N 13/293 (2018.01);
U.S. Cl.
CPC ...
H04N 13/293 (2018.05); A61B 3/102 (2013.01); A61B 3/12 (2013.01); A61B 3/14 (2013.01);
Abstract
An ophthalmic information processing apparatus includes a specifying unit and an image deforming unit. The specifying unit is configured to specify a three-dimensional position of each pixel in a two-dimensional front image depicting a predetermined site of a subject's eye, based on OCT data obtained by performing optical coherence tomography on the predetermined site. The image deforming unit is configured to deform the two-dimensional front image, by changing position of at least one pixel in the two-dimensional front image based on the three-dimensional position, to generate a three-dimensional front image.