The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Nov. 24, 2021
At&t Intellectual Property I, L.p., Atlanta, GA (US);
Edmond J. Abrahamian, Richmond Heights, MO (US);
Andrew Campbell, Pleasant Hill, CA (US);
Ana Armenta, San Jose, CA (US);
Prince Paulraj, Coppell, TX (US);
AT&T Intellectual Property I, L.P., Atlanta, GA (US);
Abstract
Anomalies associated with events relating to users or user accounts can be detected. An anomaly detection management component (ADMC) determines embedded arrays comprising data bit groups representative of groups of properties and groups of relationships between properties associated with users, based on analysis of data related to events associated with users. ADMC trains a neural network (NN) based on applying embedded arrays to NN, in accordance with an artificial intelligence (AI) analysis process. ADMC determines an embedded array comprising data bits representative of properties and relationships between properties associated with a user based on analysis of data associated with the user. Trained NN can determine a pattern relating to the properties and relationships associated with the user based on AI-based analysis of the embedded array. Trained NN can detect an anomaly in the pattern based on AI-based analysis of the pattern, wherein the anomaly relates to an event.