The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jul. 31, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Darren Tipton, Poering, DE;

Johan Nilsson, Hoehenkirchen-Siergertsbrunn, DE;

Christian Kuhn, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/20 (2015.01);
U.S. Cl.
CPC ...
H04B 17/25 (2023.05); H04B 17/201 (2023.05);
Abstract

The invention relates to a measurement system, including a signal analyzer or monitoring receiver, for measuring and analyzing modulated signals. The system includes a signal acquisition device having input port(s), wherein the signal acquisition device is configured to capture modulated signal(s) applied to the input ports, wherein each captured modulated signal can be represented as an I/Q signal; wherein the signal acquisition device generates at least two digital I/Q data streams based on the one or more modulated signals, wherein the at least two digital I/Q data streams are generated in parallel. The measurement system includes a selection device to select at least one target frequency bandwidth in each of the at least two digital I/Q data streams; and a signal processing device configured to analyze the at least two digital I/Q data streams in the selected target frequency bandwidths.


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