The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Apr. 07, 2022
Applicant:

Proteantecs Ltd., Haifa, IL;

Inventors:

Eyal Fayneh, Givatayim, IL;

Inbar Weintrob, Givat Ada, IL;

Evelyn Landman, Haifa, IL;

Faten Tanasra, Nazareth, IL;

Guy Redler, Haifa, IL;

Shai Tzroia, Haifa, IL;

Assignee:

PROTEANTECS LTD., Haifa, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/093 (2006.01); G06F 1/04 (2006.01); G06F 1/08 (2006.01); G06F 1/28 (2006.01); G06F 1/30 (2006.01);
U.S. Cl.
CPC ...
H03L 7/093 (2013.01); G06F 1/04 (2013.01); G06F 1/08 (2013.01); G06F 1/28 (2013.01); G06F 1/305 (2013.01); H03L 2207/08 (2013.01);
Abstract

Generation of a clock signal in a semiconductor integrated circuit (IC) is controlled using a Noise Modulation Agent (NMA), configured to measure the clock signal and output a parameter indicative of an effective cycle time of the clock signal. An Adaptive Frequency Scaling (AFS) circuit selectively adjusts a frequency of the clock signal, based on the output of the NMA indicating a change in a power supply voltage of the semiconductor IC.


Find Patent Forward Citations

Fayneh, Eyal. (2025). Adaptive frequency scaling based on clock cycle time measurement (U.S. Patent No. 12470223). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12470223

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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