The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jan. 21, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Ni Zhang, Beijing, CN;

Xiaoyi Chen, Beijing, CN;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/84 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/84 (2022.01);
Abstract

Embodiments of the present disclosure relate to a method, a device and a computer storage medium for data analysis. The method comprises: obtaining a prediction model, a processing layer of the prediction model comprising a plurality of processing units, parameters of each of the a plurality of processing units satisfying an objective parameter distribution, an output of the prediction model being determined based on a plurality of groups of parameters determined from the parameter distribution; and applying model input data to the prediction model, so as to obtain a prediction for the model input data. In this way, a more accurate prediction result may be obtained.


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