The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jan. 30, 2023
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Te Tang, Fremont, CA (US);

Tetsuaki Kato, Fremont, CA (US);

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/776 (2022.01); B25J 9/16 (2006.01); G06V 10/26 (2022.01); G06V 10/764 (2022.01); G06V 10/77 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06V 10/776 (2022.01); B25J 9/1697 (2013.01); G06V 10/26 (2022.01); G06V 10/764 (2022.01); G06V 10/7715 (2022.01); G06V 10/7747 (2022.01); G06V 10/82 (2022.01); G06V 2201/06 (2022.01);
Abstract

A system and method for adapting a feature extraction neural network to only identify environment independent features in an image. The method includes modifying weights within a dataset classifier neural network to improve the accuracy of the ability of the dataset classifier neural network to identify that training features images are from training images and test features images are from test images. The method also includes modifying the weights within a feature extraction neural network to reduce the accuracy of the ability of the dataset classifier neural network to identify that the training features images are from the training images and the test features images are from the test images.


Find Patent Forward Citations

Loading…