The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jul. 27, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Takahiro Toizumi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/776 (2022.01); G06T 7/11 (2017.01); G06V 10/44 (2022.01);
U.S. Cl.
CPC ...
G06V 10/776 (2022.01); G06T 7/11 (2017.01); G06V 10/443 (2022.01); G06V 2201/02 (2022.01);
Abstract

A learning system includes: an area candidate generation unit that generates an area candidate that is a candidate for an area in which an object is detected from an image; a ground truth area acquisition unit that obtains information about a ground truth area including the object; and a ground truth target generation unit that generates a ground truth target used for learning of an object detection unit that detects the object from the image, on the basis of a score indicating a degree of area matching between the area candidate and the ground truth area and a size of the ground truth area. According to such a learning system, it is possible to properly perform the learning in accordance with the size of the ground truth area.


Find Patent Forward Citations

Toizumi, Takahiro. (2025). Learning system, object detection system, learning method, and computer program (U.S. Patent No. 12469263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12469263

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