The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jul. 28, 2022
Applicant:

Carl Zeiss Meditec Ag, Jena, DE;

Inventors:

Markus Philipp, Stuttgart, DE;

Stefan Saur, Aalen, DE;

Anna Alperovich, Aalen, DE;

Franziska Mathis-Ullrich, Karlsruhe, DE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/74 (2022.01); G06T 7/246 (2017.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06V 10/74 (2022.01); G06T 7/246 (2017.01); G06V 10/77 (2022.01);
Abstract

A computer-implemented method for generating a control signal by locating at least one instrument by way of a combination of machine learning systems on the basis of digital images is described. In this case, the method includes determining parameter values of a movement context by using the at least two digital images and determining an influence parameter value which controls an influence of one of the digital images and the parameter values of the movement context on the input data which are used within a first trained machine learning system, which has a first learning model, for generating the control signal.


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