The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Apr. 28, 2021
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Natsuki Kai, Tokyo, JP;

Takahiro Shiroshima, Tokyo, JP;

Hideo Saito, Kanagawa, JP;

Masahiro Yamaguchi, Kanagawa, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 17/05 (2011.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 17/05 (2013.01);
Abstract

A positioning device includes an acquisition unit that acquires an environmental map of a target area being generated by using an image processing technique for estimating a three-dimensional shape of a target included in a two-dimensional image, and a plurality of captured images being used for generating the environmental map, an image retrieval unit that extracts, from a plurality of the captured images, a similar image having a feature vector similar to a feature vector determined based on a feature amount included in an input image, and an estimation unit that estimates a position and an attitude of an imaging device that has captured the input image by using a first feature point group of the input image and a third feature point group in the environmental map associated to a second feature point group of the similar image being matched with the first feature point group.


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