The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Mar. 29, 2021
Semiconductor Energy Laboratory Co., Ltd., Atsugi, JP;
Teppei Oguni, Kanagawa, JP;
Yusuke Koumura, Kanagawa, JP;
Semiconductor Energy Laboratory Co., Ltd., Kanagawa-ken, JP;
Abstract
A position estimation system with low power consumption is provided. The position estimation system includes a comparison unit, a learning unit, a data acquisition unit, an inference unit, a data conversion unit, and an evaluation unit. The comparison unit has a function of calculating a first parallel movement amount and a first rotation amount on the basis of machine learning data representing geographic information. The learning unit has a function of generating a machine learning model through learning using the machine learning data, the first parallel movement amount, and the first rotation amount. The data acquisition unit has a function of acquiring acquisition data representing environmental information on the vicinity of a position estimation device. The inference unit has a function of inferring a second parallel movement amount and a second rotation amount, with use of the machine learning model, on the basis of the acquisition data and the machine learning data. The data conversion unit has a function of converting the machine learning data to evaluation data on the basis of the second parallel movement amount and the second rotation amount. The evaluation unit has a function of evaluating the degree of correspondence between the acquisition data and the evaluation data.