The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Oct. 17, 2022
Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;
Ukyou Katsura, Osaka, JP;
Toru Matsunobu, Osaka, JP;
Toshiyasu Sugio, Osaka, JP;
Tomokazu Ichiriki, Kanagawa, JP;
Masanori Kimura, Osaka, JP;
Abstract
A filling rate measurement method includes: obtaining a space three-dimensional model generated by measuring a first storage having an opening and a first storage space in which a measurement target is to be stored, the measuring being performed using a range sensor facing the first storage; obtaining a storage three-dimensional model that is a three-dimensional model of the first storage in which the measurement target is not stored; extracting a target portion corresponding to the measurement target from the space three-dimensional model using the space three-dimensional model and the storage three-dimensional model; calculating a first three-dimensional coordinate system; estimating a target three-dimensional model using the target portion and the first three-dimensional coordinate system, the target three-dimensional model being a three-dimensional model of the measurement target in the first storage space; and calculating a first filling rate of the measurement target with respect to the first storage space.