The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Dec. 02, 2021
Applicant:
Fujifilm Healthcare Corporation, Chiba, JP;
Inventors:
Toru Shirai, Chiba, JP;
Ryota Satoh, Chiba, JP;
Tomoki Amemiya, Chiba, JP;
Yoshitaka Bito, Chiba, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 5/00 (2006.01); A61B 5/055 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 5/0042 (2013.01); A61B 5/055 (2013.01); G06T 7/11 (2017.01); G06T 2207/10088 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30016 (2013.01);
Abstract
An image including contrast is standardized and an area is divided, a measurement cross section that most matches a measurement cross section determined to be appropriate for measuring a predetermined index is determined based on a feature of a notable tissue in the divided area, and a measurement value serving as an index is calculated in the measurement cross section.