The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Jan. 02, 2024
Applicant:
Dürr Systems Ag, Bietigheim-Bissingen, DE;
Inventors:
Dietmar Wieland, Waiblingen, DE;
Oliver Iglauer-Angrik, Stuttgart, DE;
Kevin Woll, Heilbronn, DE;
Andreas Gienger, Kirchheim unter Teck, DE;
Oliver Sawodny, Stuttgart, DE;
Assignee:
Dürr Systems AG, Bietigheim-Bissingen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0633 (2023.01); G05B 19/418 (2006.01); G06Q 10/0639 (2023.01); G06Q 50/04 (2012.01);
U.S. Cl.
CPC ...
G06Q 10/0633 (2013.01); G05B 19/41875 (2013.01); G06Q 10/06395 (2013.01); G06Q 50/04 (2013.01); G05B 2219/32217 (2013.01); G05B 2219/37206 (2013.01); G05B 2219/45013 (2013.01);
Abstract
In order to provide a checking facility for checking workpieces and also a treatment facility for treating workpieces, which enable efficient and reliable quality optimisation, it is proposed that workpiece parameters are detected, for example by means of an automatic checking station, and a workpiece-specific data set is created on this basis and/or from facility parameters.