The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

May. 09, 2022
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Dong Hai Yu, Xian, CN;

Jun Wang, Xi'an, CN;

Bo Song, Xian, CN;

Yao Dong Liu, Xian, CN;

Jiang Bo Kang, Xian, CN;

Lei Tian, Xi'an, CN;

Xing Wei, Xi'an, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06Q 20/40 (2012.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06Q 20/4016 (2013.01);
Abstract

A computer-implemented system, platform, programing product, and/or method for improving transformation selection in an ensemble machine learning (ML) model that includes: providing all base ML models of the ensemble ML model; identifying all of a plurality of Derived Fields in all the base ML models; performing a Derived Field run prediction analysis for all the Derived Fields; computing the Derived Field Importance Weight for Field (DFIW4F) and the Derived Field Importance Weight for Model (DFIW4M) for all the Derived Fields; clustering all the Derived Fields into a plurality of Derived Field clusters, wherein each Derived Field cluster is based upon the DFIW4M and the DFIW4F for the Derived Field; sorting all the Derived Field clusters by best cluster based upon DFIW4M and DFIW4F; and running the base ML models based upon the Derived Fields in the best Derived Field cluster until sufficient base ML models have been run.


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