The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Nov. 22, 2021
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Xianzhi Du, College Park, MD (US);

Mostafa El-Khamy, Durham, NC (US);

Jungwon Lee, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 18/214 (2023.01); G06N 3/045 (2023.01); G06N 3/084 (2023.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01); G06V 10/70 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/214 (2023.01); G06N 3/045 (2023.01); G06N 3/084 (2013.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01); G06V 10/70 (2022.01); G06V 10/774 (2022.01); G06V 10/82 (2022.01);
Abstract

Methods and apparatuses for deep learning training are provided which include receiving a candidate unit for classification. The candidate unit including an intersection area between a ground-truth bounding box and a detection box. The candidate unit is classified by assigning a label that is a probability value that a given feature is observed in the intersection area. Deep learning training is performed using the assigned label of the classified candidate unit.


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