The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Nov. 16, 2023
Capital One Services, Llc, McLean, VA (US);
Matthew Louis Nowak, Midlothian, VA (US);
Catherine Barnes, Glen Allen, VA (US);
Maqbool A. Khatri, Glen Allen, VA (US);
Kelvin Wong, Brooklyn, NY (US);
James C. Mcgrory, Richmond, VA (US);
Justin Cheng, Vienna, VA (US);
Rees Draminski, Vienna, VA (US);
Alan Christopher Weaver, Glen Allen, VA (US);
David Walter Peters, Richmond, VA (US);
Narender Pashikant, Ashburn, VA (US);
Sean O'Neill, Collegeville, PA (US);
Capital One Services, LLC, McLean, VA (US);
Abstract
In some implementations, a data quality system may receive an incoming data set for data quality analysis. The data quality system may obtain data quality validation information from one or more data repositories that form a data quality knowledge base. The data quality system may use one or more machine learning models to evaluate whether the incoming data set has one or more anomalies based on the data quality validation information. The data quality system may generate data quality results for the incoming data set based on an output from the one or more machine learning models. The data quality system may update the data quality knowledge base in accordance with the data quality results for the incoming data set.