The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jun. 13, 2023
Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Gaurav Bhandari, Bangalore, IN;

Raghunath D, Bangalore, IN;

Prakash M. Hiremath, Bangalore, IN;

Ashish Vasant Joglekar, Bangalore, IN;

Devadatta Madhukar Kulkarni, Rochester Hills, MI (US);

Sampad Mohanty, Los Angeles, CA (US);

Venkatesh Prabhu, Bangalore, IN;

Rajeev Shorey, Haryana, IN;

Rajesh Sundaresan, Bangalore, IN;

Jeffrey David Tew, Rochester, MI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/41865 (2013.01); G05B 2219/32252 (2013.01);
Abstract

Present disclosure relates to method and synchronization system for synchronizing plurality of events associated with one or more processes in assembly line for tracing entity. Initially, information related to plurality of events associated with one or more processes from one or more devices is received, where each of the plurality of events comprises respective first timestamp. Upon receiving, the first timestamp between each of the plurality of events is synchronized by performing first level and second level synchronization. The synchronization converts first timestamp into second timestamp with respect to common reference timestamp. Further, the synchronization system may identify one or more defects based on quality value assigned to entity. Thus, the present disclosure helps the synchronization system to efficiently trace entity when a defect is identified and replaces/repairs the entity.


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