The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jun. 20, 2025
Applicant:

SR Technologies, Inc., Sunrise, FL (US);

Inventors:

Graham K. Smith, Boca Raton, FL (US);

Kyle Patrick Kelly, Palm Beach Gardens, FL (US);

Mark Passler, Rockville, MD (US);

Assignee:

SR Technologies, Inc., Sunrise, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/28 (2006.01); H01Q 21/06 (2006.01);
U.S. Cl.
CPC ...
G01S 3/28 (2013.01); H01Q 21/06 (2013.01);
Abstract

A method for determining an angle of arrival (AoA) of a radio frequency (RF) signal received at an antenna array. The method includes determining theoretical signals to be received at an antenna array having first and second antenna pairs. Antennas of the first antenna pair are offset from each other by a first offset angle and antennas of the second antenna pair are offset from each other by a second offset angle. A look-up table is generated based on the theoretical signals. An RF signal is received at each antenna pair and the antenna outputs in each antenna pair are combined to produce first and second difference values. The first and second difference values are compared to theoretical difference values in the look-up table. A measured AoA of the RF signal is determined based on the comparison of the first and second difference values to the theoretical difference values.


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