The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Feb. 23, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventor:

Yulin Chang, Belmont, MA (US);

Assignee:

Siemens Healthineers AG, Forchheim, DE;

Primary Examiner:
Int. Cl.
CPC ...
G01R 33/565 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56563 (2013.01); G01R 33/5608 (2013.01);
Abstract

Systems and methods include determination of a field map representing inhomogeneity of a main magnetic field of a magnetic resonance scanner within a subject, determination of a pixel shift map based on the field map, operation of the magnetic resonance scanner to generate an image of the subject, determination of a portion of the pixel shift map corresponding to a phase-encoding line of the image, determination of a distortion matrix corresponding to the portion of the pixel shift map, determination of a locally-regularized pseudoinverse distortion matrix based on the distortion matrix, and correction of the line of the image based on the locally-regularized pseudoinverse distortion matrix.


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Chang, Yulin. (2025). Geometric distortion correction using local regularization (U.S. Patent No. 12467999). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12467999

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