The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jan. 08, 2024
Applicant:

Nova Semiconductor Inc., San Jose, CA (US);

Inventor:

Ahmad Ashrafzadeh, Morgan Hill, CA (US);

Assignee:

Nova Semiconductor Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H02J 7/00 (2006.01); G01R 31/3835 (2019.01); G01R 31/396 (2019.01); H01M 10/48 (2006.01); H01M 50/51 (2021.01); H02M 7/155 (2006.01); H03K 19/17784 (2020.01);
U.S. Cl.
CPC ...
G01R 31/396 (2019.01); G01R 31/3835 (2019.01); H01M 10/482 (2013.01); H01M 10/486 (2013.01); H01M 50/51 (2021.01); H02J 7/0014 (2013.01); H02J 7/0019 (2013.01); H02J 7/0048 (2020.01); H02M 7/1557 (2013.01); H03K 19/17784 (2013.01);
Abstract

A method for measuring electrical quantities in an electrical system includes obtaining a first set of known electrical outputs of an electrical quantity sensor at a first temperature. The method also includes obtaining a second set of known electrical outputs of the electrical quantity sensor at a second temperature that is different from the first temperature. The method further includes measuring an operational temperature of one or more locations in the electrical system. The method still further includes computing a pair of reference electrical output values corresponding to the measured operational temperature in accordance with the first set of known electrical outputs at the first temperature and the second set of known electrical outputs at the second temperature. The method also includes interpolating among the pair of computed reference electrical output values to determine a temperature-corrected electrical quantity based on the measured operational temperature and the reference electrical output values.


Find Patent Forward Citations

Loading…