The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Jun. 12, 2023
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Matthias Ruengeler, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
The present disclosure generally relates to a method of determining a figure of merit of at least one component under test within a signal chain and a measurement instrument. The signal chain has several components and is an internal and/or external signal chain. A measurement signal is captured at a port of the signal chain. An overall figure of merit of the signal chain is determined. The measurement signal is repeatedly captured at the port of the signal chain while altering at least one setting of one of the several components of the signal chain per repetition. The overall figure of merit of the signal chain is determined for each repetition. The at least one setting is altered such that the contribution of the respective component under test to the overall figure of merit of the signal chain is increased with respect to contributions of remaining components of the signal chain.