The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Mar. 29, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Benjamin Haehlke, Munich, DE;

Pascal Wolff, Munich, DE;

Vincent Abadie, Munich, DE;

Ralf Zoll, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01); G01R 29/105 (2013.01);
Abstract

The present disclosure provides a method of determining a setting for performing a spurious emission measurement of a device under test. A preliminary total radiated power (TRP) measurement of a wanted signal of the device under test is performed along a three-dimensional measurement grid that includes several measurement points. Equivalent isotropic radiated power (EIRP) values are determined for the measurement points during the preliminary total radiated power measurement. The equivalent isotropic radiated power values gathered are evaluated with respect to a threshold value, thereby determining at least one subset of the equivalent isotropic radiated power values. In addition, a method of performing spurious emission measurements is described.


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