The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

May. 19, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Julius Seeger, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 1/30 (2006.01); G01R 13/02 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0416 (2013.01); G01R 1/30 (2013.01); G01R 13/02 (2013.01); G01R 35/005 (2013.01);
Abstract

A configuration method of configuring a measurement instrument is described. The measurement instrument comprises at least one measurement port being connectable to at least one device under test. The measurement instrument further comprises a control circuit and a measurement circuit. The control circuit is connected to the measurement circuit. The measurement circuit is connected to the at least one measurement port. The configuration method comprises the steps of: comparing a loaded test routine with configuration data stored in the measurement instrument, determining whether the test routine is performable by the measurement instrument based on the comparison of the test routine with the configuration data; and adapting the loaded test routine based on the configuration data.


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