The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Oct. 21, 2022
Applicant:

Movella Holdings B.v., Enschede, NL;

Inventor:

Raymond Zandbergen, Enschede, NL;

Assignee:

Movella Holdings B.V., Enschede, NL;

Primary Examiner:
Int. Cl.
CPC ...
G01P 15/08 (2006.01); A61B 5/00 (2006.01); G01P 13/00 (2006.01);
U.S. Cl.
CPC ...
G01P 15/08 (2013.01); A61B 5/4504 (2013.01); A61B 5/7235 (2013.01); G01P 13/00 (2013.01); A61B 2562/0219 (2013.01);
Abstract

A method for an inertial measurement unit (IMU) coupled to a user includes determining, with a plurality of accelerometers in the IMU, a plurality of acceleration data in response to a movement by the user, computing, with a processor in the IMU, a plurality of gravity vector data in response to the plurality of acceleration data, computing, with the processor in the IMU, a plurality of jerk data in response to the plurality of acceleration data, and outputting, with the IMU, the plurality of gravity vector data and the plurality of jerk data to an external processing unit.


Find Patent Forward Citations

Zandbergen, Raymond. (2025). Systems and methods for high-quality jerk data (U.S. Patent No. 12467940). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12467940

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…