The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Jul. 17, 2023
The George Washington University, Washington, DC (US);
Philippe M. Bardet, Washington, DC (US);
Peter D. Huck, Washington, DC (US);
Charles Fort, Washington, DC (US);
The George Washington University, Washington, DC (US);
Abstract
Aspects of this disclosure are directed to optical probes for collecting images of a region of interest for determining wall shear stress. The optical probe includes an imager with a line of sight and a light guide configured to steer light from a light source to the region of interest. The optical probe includes an objective configured to focus light reflected off of the region of interest to the line of sight of the imager. The optical probe can include a micro-lens array at the objective. The micro-lens array can focus light from the objective onto the imager. The imager can collect images from the light from the micro-lens array for determining wall shear stress at the region of interest.