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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12467912 B1

PDFFull Text
Date of Patent:
Nov. 11, 2025

Filed:

Oct. 08, 2021

Element analysis method, element analysis device, and non-transitory computer readable medium storing program for element analysis device

Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Takahito Inoue, Kyoto, JP;

Hiroshi Uchihara, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, JP;

Attorney:

LUCAS & MERCANTI, LLP

Primary Examiner:

Jennifer Wecker

Assistant Examiner:

Oyeleye Alexander Alabi

Int. Cl.
CPC ...
B01L 3/00 (2006.01); B01D 15/08 (2006.01); B01F 33/302 (2022.01); B01F 33/3033 (2022.01); B01J 20/285 (2006.01); B01J 20/287 (2006.01); B01J 20/32 (2006.01); B01L 7/00 (2006.01); B01L 9/00 (2006.01); B65G 47/80 (2006.01); B82Y 20/00 (2011.01); B82Y 30/00 (2011.01); B82Y 40/00 (2011.01); C12M 1/34 (2006.01); C12M 3/06 (2006.01); C12N 1/14 (2006.01); C12N 1/20 (2006.01); C12Q 1/02 (2006.01); C12Q 1/6806 (2018.01); C12Q 1/6844 (2018.01); C12Q 1/6848 (2018.01); C12Q 1/686 (2018.01); G01N 1/44 (2006.01); G01N 15/10 (2024.01); G01N 15/14 (2024.01); G01N 15/1433 (2024.01); G01N 21/29 (2006.01); G01N 21/33 (2006.01); G01N 21/65 (2006.01); G01N 30/02 (2006.01); G01N 30/60 (2006.01); G01N 30/72 (2006.01); G01N 31/12 (2006.01); G01N 33/543 (2006.01); G01N 33/557 (2006.01); G01N 33/574 (2006.01); G01N 33/58 (2006.01); G01N 33/68 (2006.01); G01N 35/00 (2006.01); H05B 45/10 (2020.01);
U.S. Cl.
CPC ...
G01N 31/12 (2013.01); G01N 1/44 (2013.01);
Abstract

An element analysis method is capable of maintaining accuracy of zero-point correction equivalent to that in the related art while shortening the time required for element analysis. The method includes heating a sample placed in a crucible in a heating furnace, and measuring an amount of an element contained in a gas discharged from the heating furnace by an analysis mechanism to analyze the element contained in the sample. The method includes: a blank measurement step of measuring the amount of the element contained in the gas discharged from the heating furnace when only the crucible is heated; and a step of setting an amount of zero-point correction based on a measurement value in a transient state region where the measurement value rises in blank data obtained in the blank measurement step.

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