The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jul. 13, 2023
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Soichiro Tamaoki, Kyoto, JP;

Tomoyuki Yamazaki, Kyoto, JP;

Shohei Sato, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/16 (2006.01); G01N 30/72 (2006.01); G01N 30/74 (2006.01); G01N 30/80 (2006.01); G01N 30/32 (2006.01);
U.S. Cl.
CPC ...
G01N 30/16 (2013.01); G01N 30/72 (2013.01); G01N 30/74 (2013.01); G01N 30/80 (2013.01); G01N 2030/326 (2013.01);
Abstract

Provided is a preparative liquid chromatograph capable of coping with a case where actual second delay time changes after start of a fractionation sequence. When a specific component detected as a peak in both a first detector and a second detector is injected during execution of a fractionation sequence, a control device executes maintenance operation of time difference information stored in an information storage area. In the maintenance operation, the control device executes peak determination as to whether or not a difference between first retention time and second retention time falls within a predetermined allowable range. By the above, the control device checks whether or not the second delay time from when a component is detected by the second detector to when the component reaches a fraction collector changes from a previous state.


Find Patent Forward Citations

Loading…