The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Jun. 16, 2021
Applicant:
Rosen Swiss Ag, Stans, CH;
Inventors:
Tobias Roelfes, Spelle, DE;
Hanna Krümpel, Neuenkirchen, DE;
Assignee:
Rosen IP AG, Stans, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/07 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/043 (2013.01); G01N 29/07 (2013.01); G01N 29/2412 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/0289 (2013.01); G01N 2291/0427 (2013.01); G01N 2291/106 (2013.01);
Abstract
A method is provided in which an ultrasonic signal is generated as an electromagnetic ultrasonic signal by the at least one transmitting transducer, which is in the form of an EMUS transducer, by means of a conductive layer arranged on the surface of the object or in said object. An evaluation apparatus is used to utilize the ultrasonic signal detected by the at least one receiving transducer, which is in the form of an EMUS transducer, in order to determine a flaw in the form of a delamination, a porefield or other such two-dimensional inhomogeneities.