The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jul. 21, 2021
Applicant:

Sharp Kabushiki Kaisha, Sakai, JP;

Inventors:

Kazuya Tsujino, Sakai, JP;

Tomohiro Kosaka, Sakai, JP;

Tomoko Teranishi, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/624 (2021.01);
U.S. Cl.
CPC ...
G01N 27/624 (2013.01);
Abstract

Provided is an analysis device capable of analyzing a wide range of ion concentrations. The analysis device includes: an ion separating unit selectively conducting a specific kind of ions from among a plurality of kinds of ions flowing through a flow path; a detection electrode provided in the flow path and disposed toward an outlet with respect to the ionization unit; and a deflection electrode positioned across the flow path from the detection electrode, and generating an electric field that moves the specific kind of ions toward the detection electrode. The deflection electrode is capable of adjusting a width of a region in which the electric field is generated in a width direction perpendicular to a direction in which the flow path extends.


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