The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Aug. 03, 2023
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Assignee:
SHIMADZU CORPORATION, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/083 (2018.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G01N 23/043 (2013.01); G01N 23/083 (2013.01); G06T 7/74 (2017.01); G06T 2207/10116 (2013.01); G06T 2207/20081 (2013.01);
Abstract
In an X-ray imaging, first and second images of X-ray images corresponding to different emission angles are generated. In the X-ray imaging system, based on positions of a target part included in an inspection target in the first and second images, and an angle difference between the emission angles of X-rays that are emitted to generate the first and second images, a three-dimensional position of the target part is calculated by using triangulation.
Sawada, Ryuji. (2025). X-ray imaging system and x-ray image analysis method (U.S. Patent No. 12467884). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12467884
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile