The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Jul. 20, 2023
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/041 (2018.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01N 23/041 (2018.02); G01N 23/046 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/309 (2013.01); G01N 2223/32 (2013.01); G01N 2223/401 (2013.01); G01N 2223/408 (2013.01); G01N 2223/413 (2013.01); G01N 2223/419 (2013.01); G01N 2223/426 (2013.01); G01N 2223/615 (2013.01); G01N 2223/646 (2013.01);
Abstract
An X-ray phase imaging apparatus includes an X-ray source; a detector; a plurality of gratings; a rotation mechanism; an image processor configured to generate a phase contrast image and to generate a preview image prior to capture of the phase contrast image; and a controller configured to control function of displaying on a display the preview image, and function of discriminatively displaying on the display an image coverage area for the phase contrast image that is associated with a relative rotation angle between the plurality of gratings and a subject.