The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Dec. 12, 2023
Applicant:
Rapiscan Holdings, Inc., Hawthorne, CA (US);
Inventor:
James Ollier, Huyton, GB;
Assignee:
Rapiscan Holdings, Inc., Torrance, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/06 (2006.01); A61B 6/40 (2024.01); A61B 6/42 (2024.01); G01N 23/04 (2018.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); A61B 6/06 (2013.01); A61B 6/4078 (2013.01); A61B 6/4092 (2013.01); A61B 6/4241 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/304 (2013.01); G01N 2223/306 (2013.01); G01N 2223/316 (2013.01); G01N 2223/33 (2013.01);
Abstract
Systems and methods to monitor output energy of an X-ray source being used to emit a fan beam for scanning an object in a scanning system include a segmented detector positioned between a target of the X-ray source and the object. The segmented detector has at least two segments that are placed to cover at least two angular ranges of the fan beam and generate corresponding two sets of energy distribution data. A ratio is determined based on the two sets of energy distribution data in order to determine an initial electron energy and an end-point energy of the X-ray source based on the ratio.