The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Sep. 22, 2023
Applicant:

Tianma Japan, Ltd., Kanagawa, JP;

Inventors:

Sho Onose, Kanagawa, JP;

Ayuko Imai, Kanagawa, JP;

Ken Sumiyoshi, Kanagawa, JP;

Assignee:

TIANMA JAPAN, LTD., Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 33/58 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6445 (2013.01); G01N 33/582 (2013.01); G01N 21/64 (2013.01); G01N 21/6428 (2013.01); G01N 33/53 (2013.01);
Abstract

A degree of polarization of second reference samples produced by adding an antibody, a tracer, and a target substance having mutually different concentrations to a first reference sample not including the target substance is corrected with a degree of polarization of the first reference sample to generate a first calibration curve. A degree of polarization of a second sample to be measured produced by adding the antibody and the tracer to a first sample to be measured in amounts equal to those added to the second reference samples is corrected with a degree of polarization of the first sample to be measured to obtain the concentration of the target substance in the first calibration curve.


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