The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Jul. 02, 2024
Applicant:
Trustees of Boston University, Boston, MA (US);
Inventors:
Ji-Xin Cheng, Newton, MA (US);
Qing Xia, Boston, MA (US);
Assignee:
Trustees of Boston University, Boston, MA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/1434 (2024.01); G01N 15/01 (2024.01);
U.S. Cl.
CPC ...
G01N 15/01 (2024.01); G01N 15/1434 (2013.01); G01N 2015/1452 (2013.01);
Abstract
A wide-field microscopy system and method for imaging a sample include directing infrared light onto the sample to selectively heat the sample. Probe light is also directed onto the sample. An objective collects the probe light after it interacts with the sample. The collected probe light is detected at a detector. A relative distance between the objective and sample is adjusted to introduce an optical defocus enhancement to enhance detection of a change in detected probe light that is indicative of infrared absorption by the sample.