The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Jul. 14, 2021
Applicant:
Kunshan Go-visionox Opto-electronics Co., Ltd, Jiangsu, CN;
Inventors:
Xiangli Wu, Kunshan, CN;
Xingxing Yang, Kunshan, CN;
Assignee:
KUNSHAN GO-VISIONOX OPTO-ELECTRONICS CO., LTD, Kunshan, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/20 (2006.01);
U.S. Cl.
CPC ...
G01N 3/20 (2013.01);
Abstract
A bending test device. The bending test device includes a base and at least one carrier component disposed on the base, where each of the at least one carrier component includes a horizontal fixed portion and two moving portions rotatably connected to two sides of the horizontal fixed portion respectively, and each of the two moving portions has motion freedom to turn up and down relative to the horizontal fixed portion.
Wu, Xiangli. (2025). Bending test device (U.S. Patent No. 12467839). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12467839
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile