The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
May. 01, 2025
Jiangsu Second Normal University, Nanjing, CN;
Tong Jiang, Nanjing, CN;
Han Jiang, Nanjing, CN;
Xikun Wei, Nanjing, CN;
Cheng Jing, Nanjing, CN;
Jiahui Zhang, Nanjing, CN;
Jian Zhou, Nanjing, CN;
Miaoni Gao, Nanjing, CN;
Jinlong Huang, Nanjing, CN;
Jiangsu Second Normal University, Nanjing, CN;
Abstract
A high-precision solar resource assessment method based on a downscaling method for complex terrain includes steps as follows. Step (1): an average climatic field is calculated based on monitoring data of sunshine durations, climatic field interpolation results are obtained based on the average climatic field, and a climatic field is created. Step (2): a difference between data of the sunshine durations and the climatic field is calculated, anomaly field interpolation results are obtained based on the difference, and an anomaly field is created. Step (3): the climatic field interpolation results and the anomaly field interpolation results are overlayed. Step (4): bias adjustment is performed on the high-precision sunshine duration interpolation results obtained in the step (3) based on the monitoring data of the sunshine durations to obtain final results. Step (5): daily solar radiation is estimated based on the sunshine durations and extraterrestrial solar radiation.