The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Nov. 15, 2022
Alcon Inc., Fribourg, CH;
John Park, Irvine, CA (US);
Edward A. Dehoog, Long Beach, CA (US);
Alcon Inc., Fribourg, CH;
Abstract
In certain embodiments, an ophthalmic system includes an anamorphic depth gauge (ADG) device and a computer. The ADG device measures the z-location in the interior of an eye and includes a detector array arranged at an oblique angle with respect to the z-axis. The array generates a detector signal in response to detecting a light beam, which has a z-focus in the interior of the eye. A set of line focus optical elements focuses the light beam to form a line focus on the detector array, and a set of nominal focus optical elements focuses the light beam to form a nominal focus on the detector array. The computer: generates an image using the detector signal; determines the position of the nominal focus on the line focus according to the image; and determines the z-location of the z-focus from the position of the nominal focus on the line focus.