The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Jul. 22, 2021
Applicant:

Shanghai Percipio Technology Limited, Shanghai, CN;

Inventors:

Minjie Wang, Shanghai, CN;

Yushi Liang, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/22 (2006.01); G02F 1/1362 (2006.01); G06T 11/00 (2006.01); H01S 5/183 (2006.01); H04N 23/13 (2023.01);
U.S. Cl.
CPC ...
G01B 11/22 (2013.01); G02F 1/136277 (2013.01); G06T 7/521 (2017.01); G06T 11/003 (2013.01); H01S 5/18355 (2013.01); H04N 23/13 (2023.01); G06T 2207/20221 (2013.01);
Abstract

Disclosed is a depth data measuring device comprising a structured light projection unit and an imaging unit. The projection unit includes a laser generator and an LCOS (Liquid Crystal on Silicon) element for generating structured light to illuminate a subject. The LCOS enables fine projection and supports various patterns (e.g., speckles, stripes), enhancing depth imaging accuracy across scenarios. Integration with a VCSEL structure reduces power consumption and allows miniaturization. Additionally, multiple photosensitive units sharing part of the optical path are introduced to shorten the imaging time required for multi-frame depth calculation, thereby improving the frame rate.


Find Patent Forward Citations

Quick Actions:

Wang, Minjie. (2025). Depth data measuring device and structured light projection unit (U.S. Patent No. 12467744). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12467744

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…