The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Feb. 21, 2022
Applicant:

Optics11 B.v., Amsterdam, NL;

Inventors:

Niek Rijnveld, Amsterdam, NL;

Grzegorz Gruca, Amsterdam, NL;

Kevin Bielawski, Amsterdam, NL;

Massimiliano Berardi, Amsterdam, NL;

Assignee:

OPTICS11 B.V., Amsterdam, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/16 (2006.01); G01B 9/02001 (2022.01); G01D 5/353 (2006.01); G01L 1/24 (2006.01); G01L 9/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/161 (2013.01); G01B 9/0201 (2013.01); G01B 11/18 (2013.01); G01D 5/35312 (2013.01); G01L 1/245 (2013.01); G01L 9/0079 (2013.01);
Abstract

An optical sensing device includes a support with an aperture. The optical sensing device can removably hold a sample against the support around the aperture. Accordingly, a portion of the sample is free to deform through the aperture in response to a change in an environmental condition. An optical waveguide is fixedly arranged with respect to the support whereby an end of the optical waveguide faces the aperture. The end of the optical waveguide forms an optical interferometric cavity with a refractive index discontinuity at a surface of the portion of the sample that is free to deform through the aperture.


Find Patent Forward Citations

Loading…