The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Nov. 25, 2021
Applicant:

Sun Yat-sen University, Guangzhou, CN;

Inventors:

Xia Yang, Guangzhou, CN;

Junyou Qin, Guangzhou, CN;

Guisong Guo, Guangzhou, CN;

Xiaohu Zhang, Guangzhou, CN;

Assignee:

Sun Vat-sen University, Guangzhou, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 11/26 (2006.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G01B 11/002 (2013.01); G01B 11/26 (2013.01); G06T 7/73 (2017.01); G06T 2207/30204 (2013.01);
Abstract

The present disclosure provides a method and system for high-precision localization of a surface of an object, the method including making marks with a pre-set distribution density on the surface of the object; photographing the marked object and numbering the marks in the image; acquiring relative position information about each mark on the surface of the object and establishing a corresponding relationship between mark numbers and mark position information; acquiring a real-time to be-measured image and detecting marks in the real-time to-be measured image; and calculating to obtain a position of the surface of the object corresponding to the current real-time to be-measured image. The system includes a mark making module, a numbering module, a mark position relationship module, a to-be measured image module and a physical quantity calculation module.


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