The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 11, 2025
Filed:
Sep. 20, 2022
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Paul G Kwiat, Savoy, IL (US);
Colin P Lualdi, Weston, MA (US);
Spencer Johnson, El Paso, TX (US);
Kristina Meier, Urbana, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
Methods and systems are provided to generate and use pairs of highly nondegenerate frequency-entangled photons for Hong-Ou-Mandel interferometric measurement of local or remote samples. The use of highly nondegenerate frequency-entangled photon pairs enables ultra-high spatial resolutions even in the presence of background noise, dispersive intermediate media and/or dispersive or multi-interface targets, and high probe photon losses. The use of highly nondegenerate, narrow-band, frequency-entangled photon pairs for interferometric measurement of distance also allows the interferometer to be calibrated more easily for the two (or more) discrete narrow bands of wavelengths represented by the photon pairs. The use of narrow-band nondegenerate frequency-entangled photon pairs also permits improved noise rejection and increased fidelity in coincidence detection.