The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 11, 2025

Filed:

Aug. 28, 2020
Applicant:

Seco Tools Ab, Fagersta, SE;

Inventors:

Oscar Alm, Fagersta, SE;

Hindrik Engstrom, Fagersta, SE;

Tommy Larsson, Fagersta, SE;

Jonas Lauridsen, Fagersta, SE;

Malin Rydert, Fagersta, SE;

Assignee:

Seco Tools AB, Fagersta, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23B 27/14 (2006.01); B23B 1/00 (2006.01);
U.S. Cl.
CPC ...
B23B 27/148 (2013.01); B23B 1/00 (2013.01); B23B 2228/105 (2013.01);
Abstract

A coated cutting tool includes a rake face, a flank face, and a cutting edge region between and adjoining the flank face and the rake face in a nose area of a cutting tool insert. The cutting edge region is intersected by an edge line and defines a cutting edge sector that defines an cutting edge radius, r. The coated cutting tool includes a substrate with a coating having a thickness between 1 μm and 40 μm, where the coating includes an α-AlOlayer and an MTCVD TiCN layer located between the substrate and the α-AlOlayer. The α-AlOlayer exhibits a texture coefficient TC(hkl), as measured by X-ray diffraction using CuKa radiation and θ-2θ scan, defined according to Harris formula where I(hkl) is the measured integrated area intensity of the (hkl) reflection with corresponding reference intensity I(hkl), and n is the number of reflections used in the calculation.


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